1045:
1007:
122:
25:
1019:
651:
634:
629:
778:
481:
768:
371:
671:
644:
579:
639:
783:
89:
335:
599:
61:
723:
589:
536:
1023:
978:
706:
691:
617:
68:
1082:
42:
295:
728:
561:
414:
364:
108:
75:
716:
711:
609:
584:
551:
248:
788:
773:
753:
983:
556:
491:
399:
57:
46:
973:
733:
696:
541:
1011:
571:
357:
244:
758:
676:
1111:
937:
763:
1075:
686:
622:
496:
455:
161:
35:
82:
876:
1101:
881:
701:
252:
207:, a field emission gun is used to produce an electron beam that is smaller in diameter, more
1056:
886:
445:
224:
8:
851:
836:
743:
738:
681:
546:
528:
460:
450:
394:
380:
240:
220:
208:
204:
177:
126:
1068:
922:
465:
259:, and greatly increased emitter life and reliability compared with thermionic devices.
256:
173:
1106:
866:
861:
309:
301:
291:
953:
816:
748:
871:
317:
212:
185:
1052:
826:
440:
181:
1095:
902:
846:
506:
313:
193:
321:
1044:
963:
927:
821:
811:
486:
435:
197:
165:
141:
907:
841:
831:
988:
968:
409:
404:
279:
216:
184:. Schottky emitters are made by coating a tungsten tip with a layer of
349:
121:
856:
511:
287:
153:
149:
145:
24:
958:
424:
169:
157:
305:
144:
in which a sharply pointed MĂĽller-type emitter is held at several
912:
594:
932:
282:, ed. (24 October 2008). "Review of ZrO/W Schottky Cathode".
917:
180:
is enhanced by barrier lowering in the presence of a high
172:
sharpened to a tip radius of about 100 nm, or of the
336:"Keywords | Glossary of TEM Terms | JEOL"
49:. Unsourced material may be challenged and removed.
211:and with up to three orders of magnitude greater
1093:
779:Serial block-face scanning electron microscopy
482:Detectors for transmission electron microscopy
1076:
365:
274:
272:
1083:
1069:
372:
358:
269:
109:Learn how and when to remove this message
156:, so that there is sufficient potential
120:
379:
219:than can be achieved with conventional
125:Schottky-emitter electron source of an
1094:
1051:This technology-related article is a
353:
168:type, usually made of single crystal
1039:
1018:
47:adding citations to reliable sources
18:
284:Handbook of Charged Particle Optics
13:
14:
1123:
415:Timeline of microscope technology
1043:
1017:
1006:
1005:
278:
249:transmission electron microscopy
196:of the tip by approximately 2.7
160:at the emitter surface to cause
23:
774:Precession electron diffraction
34:needs additional citations for
328:
1:
262:
1055:. You can help Knowledge by
7:
10:
1128:
1038:
759:Immune electron microscopy
677:Annular dark-field imaging
492:Everhart–Thornley detector
251:is significantly improved
1001:
946:
913:Hitachi High-Technologies
895:
804:
797:
664:
608:
570:
527:
520:
474:
423:
387:
164:. Emitters are either of
938:Thermo Fisher Scientific
764:Geometric phase analysis
652:Aberration-Corrected TEM
687:Charge contrast imaging
497:Field electron emission
162:field electron emission
877:Thomas Eugene Everhart
129:
882:Vernon Ellis Cosslett
702:Dark-field microscopy
253:signal-to-noise ratio
243:. The result in both
152:relative to a nearby
124:
887:Vladimir K. Zworykin
537:Correlative light EM
446:Electron diffraction
225:lanthanum hexaboride
223:such as tungsten or
205:electron microscopes
58:"Field emission gun"
43:improve this article
16:Type of electron gun
852:Manfred von Ardenne
837:Gerasimos Danilatos
744:Electron tomography
739:Electron holography
682:Cathodoluminescence
461:Secondary electrons
451:Electron scattering
395:Electron microscopy
381:Electron microscopy
221:thermionic emitters
178:thermionic emission
127:Electron microscope
974:Digital Micrograph
580:Environmental SEM
502:Field emission gun
466:X-ray fluorescence
257:spatial resolution
134:field emission gun
130:
1064:
1063:
1033:
1032:
997:
996:
867:Nestor J. Zaluzec
862:Maximilian Haider
660:
659:
192:) decreasing the
119:
118:
111:
93:
1119:
1112:Technology stubs
1085:
1078:
1071:
1047:
1040:
1021:
1020:
1009:
1008:
817:Bodo von Borries
802:
801:
562:Photoemission EM
525:
524:
374:
367:
360:
351:
350:
344:
343:
332:
326:
325:
286:(2nd ed.).
276:
238:
237:
236:
114:
107:
103:
100:
94:
92:
51:
27:
19:
1127:
1126:
1122:
1121:
1120:
1118:
1117:
1116:
1092:
1091:
1090:
1089:
1036:
1034:
1029:
993:
942:
891:
872:Ondrej Krivanek
793:
656:
604:
566:
552:Liquid-Phase EM
516:
475:Instrumentation
470:
428:
419:
383:
378:
348:
347:
334:
333:
329:
298:
277:
270:
265:
235:
232:
231:
230:
228:
213:current density
191:
186:zirconium oxide
176:type, in which
140:) is a type of
115:
104:
98:
95:
52:
50:
40:
28:
17:
12:
11:
5:
1125:
1115:
1114:
1109:
1104:
1088:
1087:
1080:
1073:
1065:
1062:
1061:
1048:
1031:
1030:
1028:
1027:
1015:
1002:
999:
998:
995:
994:
992:
991:
986:
981:
979:Direct methods
976:
971:
966:
961:
956:
950:
948:
944:
943:
941:
940:
935:
930:
925:
920:
915:
910:
905:
899:
897:
893:
892:
890:
889:
884:
879:
874:
869:
864:
859:
854:
849:
844:
839:
834:
829:
827:Ernst G. Bauer
824:
819:
814:
808:
806:
799:
795:
794:
792:
791:
786:
781:
776:
771:
766:
761:
756:
751:
746:
741:
736:
731:
726:
721:
720:
719:
709:
704:
699:
694:
689:
684:
679:
674:
668:
666:
662:
661:
658:
657:
655:
654:
649:
648:
647:
637:
632:
627:
626:
625:
614:
612:
606:
605:
603:
602:
597:
592:
587:
582:
576:
574:
568:
567:
565:
564:
559:
554:
549:
544:
539:
533:
531:
522:
518:
517:
515:
514:
509:
504:
499:
494:
489:
484:
478:
476:
472:
471:
469:
468:
463:
458:
453:
448:
443:
441:Bremsstrahlung
438:
432:
430:
421:
420:
418:
417:
412:
407:
402:
397:
391:
389:
385:
384:
377:
376:
369:
362:
354:
346:
345:
340:www.jeol.co.jp
327:
297:978-1420045543
296:
267:
266:
264:
261:
233:
189:
182:electric field
117:
116:
31:
29:
22:
15:
9:
6:
4:
3:
2:
1124:
1113:
1110:
1108:
1105:
1103:
1100:
1099:
1097:
1086:
1081:
1079:
1074:
1072:
1067:
1066:
1060:
1058:
1054:
1049:
1046:
1042:
1041:
1037:
1026:
1025:
1016:
1014:
1013:
1004:
1003:
1000:
990:
987:
985:
982:
980:
977:
975:
972:
970:
967:
965:
962:
960:
957:
955:
952:
951:
949:
945:
939:
936:
934:
931:
929:
926:
924:
921:
919:
916:
914:
911:
909:
906:
904:
903:Carl Zeiss AG
901:
900:
898:
896:Manufacturers
894:
888:
885:
883:
880:
878:
875:
873:
870:
868:
865:
863:
860:
858:
855:
853:
850:
848:
847:James Hillier
845:
843:
840:
838:
835:
833:
830:
828:
825:
823:
820:
818:
815:
813:
810:
809:
807:
803:
800:
796:
790:
787:
785:
782:
780:
777:
775:
772:
770:
767:
765:
762:
760:
757:
755:
752:
750:
747:
745:
742:
740:
737:
735:
732:
730:
727:
725:
722:
718:
715:
714:
713:
710:
708:
705:
703:
700:
698:
695:
693:
690:
688:
685:
683:
680:
678:
675:
673:
670:
669:
667:
663:
653:
650:
646:
643:
642:
641:
638:
636:
633:
631:
628:
624:
621:
620:
619:
616:
615:
613:
611:
607:
601:
600:Ultrafast SEM
598:
596:
593:
591:
588:
586:
583:
581:
578:
577:
575:
573:
569:
563:
560:
558:
557:Low-energy EM
555:
553:
550:
548:
545:
543:
540:
538:
535:
534:
532:
530:
526:
523:
519:
513:
510:
508:
507:Magnetic lens
505:
503:
500:
498:
495:
493:
490:
488:
485:
483:
480:
479:
477:
473:
467:
464:
462:
459:
457:
456:Kikuchi lines
454:
452:
449:
447:
444:
442:
439:
437:
434:
433:
431:
426:
422:
416:
413:
411:
408:
406:
403:
401:
398:
396:
393:
392:
390:
386:
382:
375:
370:
368:
363:
361:
356:
355:
352:
341:
337:
331:
323:
319:
315:
311:
307:
303:
299:
293:
289:
285:
281:
275:
273:
268:
260:
258:
254:
250:
246:
242:
226:
222:
218:
214:
210:
206:
201:
199:
195:
194:work function
187:
183:
179:
175:
171:
167:
163:
159:
155:
151:
147:
143:
139:
135:
128:
123:
113:
110:
102:
99:December 2019
91:
88:
84:
81:
77:
74:
70:
67:
63:
60: –
59:
55:
54:Find sources:
48:
44:
38:
37:
32:This article
30:
26:
21:
20:
1102:Vacuum tubes
1057:expanding it
1050:
1035:
1022:
1010:
964:EM Data Bank
928:Nion Company
822:Dennis Gabor
812:Albert Crewe
590:Confocal SEM
501:
487:Electron gun
436:Auger effect
339:
330:
283:
280:Orloff, John
202:
166:cold-cathode
142:electron gun
137:
133:
131:
105:
96:
86:
79:
72:
65:
53:
41:Please help
36:verification
33:
908:FEI Company
842:Harald Rose
832:Ernst Ruska
521:Microscopes
429:with matter
427:interaction
1096:Categories
989:Multislice
805:Developers
665:Techniques
410:Microscope
405:Micrograph
306:2008013026
263:References
217:brightness
69:newspapers
857:Max Knoll
512:Stigmator
322:11816479M
314:778264838
288:CRC Press
241:filaments
239:)-tipped
154:electrode
150:potential
148:negative
146:kilovolts
1107:Tungsten
1012:Category
959:CrysTBox
947:Software
618:Cryo-TEM
425:Electron
245:scanning
209:coherent
174:Schottky
170:tungsten
158:gradient
1024:Commons
672:4D STEM
645:4D STEM
623:Cryo-ET
595:SEM-XRF
585:CryoSEM
542:Cryo-EM
400:History
83:scholar
969:EMsoft
954:CASINO
933:TESCAN
798:Others
697:cryoEM
388:Basics
320:
312:
304:
294:
85:
78:
71:
64:
56:
923:Leica
769:PINEM
635:HRTEM
630:EFTEM
90:JSTOR
76:books
1053:stub
984:IUCr
918:JEOL
789:WBDF
784:WDXS
734:EBIC
729:EELS
724:ECCI
712:EBSD
692:CBED
640:STEM
310:OCLC
302:LCCN
292:ISBN
255:and
247:and
203:In
188:(ZrO
62:news
754:FEM
749:FIB
717:TKD
707:EDS
610:TEM
572:SEM
547:EMP
229:LaB
215:or
138:FEG
45:by
1098::
529:EM
338:.
318:OL
316:.
308:.
300:.
290:.
271:^
200:.
198:eV
132:A
1084:e
1077:t
1070:v
1059:.
373:e
366:t
359:v
342:.
324:.
234:6
227:(
190:2
136:(
112:)
106:(
101:)
97:(
87:·
80:·
73:·
66:·
39:.
Text is available under the Creative Commons Attribution-ShareAlike License. Additional terms may apply.