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Field emission gun

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in which a sharply pointed MĂĽller-type emitter is held at several
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is enhanced by barrier lowering in the presence of a high
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sharpened to a tip radius of about 100 nm, or of the
336:"Keywords | Glossary of TEM Terms | JEOL" 49:. Unsourced material may be challenged and removed. 211:and with up to three orders of magnitude greater 1093: 779:Serial block-face scanning electron microscopy 482:Detectors for transmission electron microscopy 1076: 365: 274: 272: 1083: 1069: 372: 358: 269: 109:Learn how and when to remove this message 156:, so that there is sufficient potential 120: 379: 219:than can be achieved with conventional 125:Schottky-emitter electron source of an 1094: 1051:This technology-related article is a 353: 168:type, usually made of single crystal 1039: 1018: 47:adding citations to reliable sources 18: 284:Handbook of Charged Particle Optics 13: 14: 1123: 415:Timeline of microscope technology 1043: 1017: 1006: 1005: 278: 249:transmission electron microscopy 196:of the tip by approximately 2.7 160:at the emitter surface to cause 23: 774:Precession electron diffraction 34:needs additional citations for 328: 1: 262: 1055:. You can help Knowledge by 7: 10: 1128: 1038: 759:Immune electron microscopy 677:Annular dark-field imaging 492:Everhart–Thornley detector 251:is significantly improved 1001: 946: 913:Hitachi High-Technologies 895: 804: 797: 664: 608: 570: 527: 520: 474: 423: 387: 164:. Emitters are either of 938:Thermo Fisher Scientific 764:Geometric phase analysis 652:Aberration-Corrected TEM 687:Charge contrast imaging 497:Field electron emission 162:field electron emission 877:Thomas Eugene Everhart 129: 882:Vernon Ellis Cosslett 702:Dark-field microscopy 253:signal-to-noise ratio 243:. The result in both 152:relative to a nearby 124: 887:Vladimir K. Zworykin 537:Correlative light EM 446:Electron diffraction 225:lanthanum hexaboride 223:such as tungsten or 205:electron microscopes 58:"Field emission gun" 43:improve this article 16:Type of electron gun 852:Manfred von Ardenne 837:Gerasimos Danilatos 744:Electron tomography 739:Electron holography 682:Cathodoluminescence 461:Secondary electrons 451:Electron scattering 395:Electron microscopy 381:Electron microscopy 221:thermionic emitters 178:thermionic emission 127:Electron microscope 974:Digital Micrograph 580:Environmental SEM 502:Field emission gun 466:X-ray fluorescence 257:spatial resolution 134:field emission gun 130: 1064: 1063: 1033: 1032: 997: 996: 867:Nestor J. Zaluzec 862:Maximilian Haider 660: 659: 192:) decreasing the 119: 118: 111: 93: 1119: 1112:Technology stubs 1085: 1078: 1071: 1047: 1040: 1021: 1020: 1009: 1008: 817:Bodo von Borries 802: 801: 562:Photoemission EM 525: 524: 374: 367: 360: 351: 350: 344: 343: 332: 326: 325: 286:(2nd ed.). 276: 238: 237: 236: 114: 107: 103: 100: 94: 92: 51: 27: 19: 1127: 1126: 1122: 1121: 1120: 1118: 1117: 1116: 1092: 1091: 1090: 1089: 1036: 1034: 1029: 993: 942: 891: 872:Ondrej Krivanek 793: 656: 604: 566: 552:Liquid-Phase EM 516: 475:Instrumentation 470: 428: 419: 383: 378: 348: 347: 334: 333: 329: 298: 277: 270: 265: 235: 232: 231: 230: 228: 213:current density 191: 186:zirconium oxide 176:type, in which 140:) is a type of 115: 104: 98: 95: 52: 50: 40: 28: 17: 12: 11: 5: 1125: 1115: 1114: 1109: 1104: 1088: 1087: 1080: 1073: 1065: 1062: 1061: 1048: 1031: 1030: 1028: 1027: 1015: 1002: 999: 998: 995: 994: 992: 991: 986: 981: 979:Direct methods 976: 971: 966: 961: 956: 950: 948: 944: 943: 941: 940: 935: 930: 925: 920: 915: 910: 905: 899: 897: 893: 892: 890: 889: 884: 879: 874: 869: 864: 859: 854: 849: 844: 839: 834: 829: 827:Ernst G. Bauer 824: 819: 814: 808: 806: 799: 795: 794: 792: 791: 786: 781: 776: 771: 766: 761: 756: 751: 746: 741: 736: 731: 726: 721: 720: 719: 709: 704: 699: 694: 689: 684: 679: 674: 668: 666: 662: 661: 658: 657: 655: 654: 649: 648: 647: 637: 632: 627: 626: 625: 614: 612: 606: 605: 603: 602: 597: 592: 587: 582: 576: 574: 568: 567: 565: 564: 559: 554: 549: 544: 539: 533: 531: 522: 518: 517: 515: 514: 509: 504: 499: 494: 489: 484: 478: 476: 472: 471: 469: 468: 463: 458: 453: 448: 443: 441:Bremsstrahlung 438: 432: 430: 421: 420: 418: 417: 412: 407: 402: 397: 391: 389: 385: 384: 377: 376: 369: 362: 354: 346: 345: 340:www.jeol.co.jp 327: 297:978-1420045543 296: 267: 266: 264: 261: 233: 189: 182:electric field 117: 116: 31: 29: 22: 15: 9: 6: 4: 3: 2: 1124: 1113: 1110: 1108: 1105: 1103: 1100: 1099: 1097: 1086: 1081: 1079: 1074: 1072: 1067: 1066: 1060: 1058: 1054: 1049: 1046: 1042: 1041: 1037: 1026: 1025: 1016: 1014: 1013: 1004: 1003: 1000: 990: 987: 985: 982: 980: 977: 975: 972: 970: 967: 965: 962: 960: 957: 955: 952: 951: 949: 945: 939: 936: 934: 931: 929: 926: 924: 921: 919: 916: 914: 911: 909: 906: 904: 903:Carl Zeiss AG 901: 900: 898: 896:Manufacturers 894: 888: 885: 883: 880: 878: 875: 873: 870: 868: 865: 863: 860: 858: 855: 853: 850: 848: 847:James Hillier 845: 843: 840: 838: 835: 833: 830: 828: 825: 823: 820: 818: 815: 813: 810: 809: 807: 803: 800: 796: 790: 787: 785: 782: 780: 777: 775: 772: 770: 767: 765: 762: 760: 757: 755: 752: 750: 747: 745: 742: 740: 737: 735: 732: 730: 727: 725: 722: 718: 715: 714: 713: 710: 708: 705: 703: 700: 698: 695: 693: 690: 688: 685: 683: 680: 678: 675: 673: 670: 669: 667: 663: 653: 650: 646: 643: 642: 641: 638: 636: 633: 631: 628: 624: 621: 620: 619: 616: 615: 613: 611: 607: 601: 600:Ultrafast SEM 598: 596: 593: 591: 588: 586: 583: 581: 578: 577: 575: 573: 569: 563: 560: 558: 557:Low-energy EM 555: 553: 550: 548: 545: 543: 540: 538: 535: 534: 532: 530: 526: 523: 519: 513: 510: 508: 507:Magnetic lens 505: 503: 500: 498: 495: 493: 490: 488: 485: 483: 480: 479: 477: 473: 467: 464: 462: 459: 457: 456:Kikuchi lines 454: 452: 449: 447: 444: 442: 439: 437: 434: 433: 431: 426: 422: 416: 413: 411: 408: 406: 403: 401: 398: 396: 393: 392: 390: 386: 382: 375: 370: 368: 363: 361: 356: 355: 352: 341: 337: 331: 323: 319: 315: 311: 307: 303: 299: 293: 289: 285: 281: 275: 273: 268: 260: 258: 254: 250: 246: 242: 226: 222: 218: 214: 210: 206: 201: 199: 195: 194:work function 187: 183: 179: 175: 171: 167: 163: 159: 155: 151: 147: 143: 139: 135: 128: 123: 113: 110: 102: 99:December 2019 91: 88: 84: 81: 77: 74: 70: 67: 63: 60: â€“  59: 55: 54:Find sources: 48: 44: 38: 37: 32:This article 30: 26: 21: 20: 1102:Vacuum tubes 1057:expanding it 1050: 1035: 1022: 1010: 964:EM Data Bank 928:Nion Company 822:Dennis Gabor 812:Albert Crewe 590:Confocal SEM 501: 487:Electron gun 436:Auger effect 339: 330: 283: 280:Orloff, John 202: 166:cold-cathode 142:electron gun 137: 133: 131: 105: 96: 86: 79: 72: 65: 53: 41:Please help 36:verification 33: 908:FEI Company 842:Harald Rose 832:Ernst Ruska 521:Microscopes 429:with matter 427:interaction 1096:Categories 989:Multislice 805:Developers 665:Techniques 410:Microscope 405:Micrograph 306:2008013026 263:References 217:brightness 69:newspapers 857:Max Knoll 512:Stigmator 322:11816479M 314:778264838 288:CRC Press 241:filaments 239:)-tipped 154:electrode 150:potential 148:negative 146:kilovolts 1107:Tungsten 1012:Category 959:CrysTBox 947:Software 618:Cryo-TEM 425:Electron 245:scanning 209:coherent 174:Schottky 170:tungsten 158:gradient 1024:Commons 672:4D STEM 645:4D STEM 623:Cryo-ET 595:SEM-XRF 585:CryoSEM 542:Cryo-EM 400:History 83:scholar 969:EMsoft 954:CASINO 933:TESCAN 798:Others 697:cryoEM 388:Basics 320:  312:  304:  294:  85:  78:  71:  64:  56:  923:Leica 769:PINEM 635:HRTEM 630:EFTEM 90:JSTOR 76:books 1053:stub 984:IUCr 918:JEOL 789:WBDF 784:WDXS 734:EBIC 729:EELS 724:ECCI 712:EBSD 692:CBED 640:STEM 310:OCLC 302:LCCN 292:ISBN 255:and 247:and 203:In 188:(ZrO 62:news 754:FEM 749:FIB 717:TKD 707:EDS 610:TEM 572:SEM 547:EMP 229:LaB 215:or 138:FEG 45:by 1098:: 529:EM 338:. 318:OL 316:. 308:. 300:. 290:. 271:^ 200:. 198:eV 132:A 1084:e 1077:t 1070:v 1059:. 373:e 366:t 359:v 342:. 324:. 234:6 227:( 190:2 136:( 112:) 106:( 101:) 97:( 87:· 80:· 73:· 66:· 39:.

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"Field emission gun"
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Electron microscope
electron gun
kilovolts
potential
electrode
gradient
field electron emission
cold-cathode
tungsten
Schottky
thermionic emission
electric field
zirconium oxide
work function
eV
electron microscopes
coherent
current density

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